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Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry's most reliable IEEE 1149.x controllers, specifically designed by us for high throughput and the best signal integrity. High-speed DataBlaster controllers are available in all of the popular formats (PCI, PCIe, PXI, USB, Ethernet, Firewire) and are performance-scalable. If economy is a priority, the Explorer controller with a USB interface is the ideal choice.
   
 
 
  JT 5705 Mixed-Signal JTAG Tester
 
The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package. The JT 5705 series offer a unique combination of JTAG TAP controller (tester) interfaces plus digital and analog I/O in compact desktop package. The JT 5705/USB version (pictured right) is a desktop model with 2 TAPs and 64 I/O making it ideal for hardware validation or small-scale production test. Maximum TCK speed is 15 MHz and all voltages are fully programmable.
   
 
 
  ATE Integration: Simple and effective  
  Want to improve the overall test coverage of your assembled boards? It's easy. Simply combine your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).

ATE integration is completely trouble free and merely involves adapting execution software to operate in the specific ATE environment. In many cases we develop dedicated, customized versions of the boundary-scan controllers or pods. This simplifies mechanical integration and preserves signal integrity.

The level of integration varies according to your needs and could involve:

  • A basic combination of application execution and diagnostic modules to allow a single operator GUI
  • A fully interlaced solution which drives test signals via boundary-scan and senses them via the native tester's pin or probe

 



Supporting products  
JT 2111/MPV  
The JT 2111/MPV (multi-purpose, multi-voltage) DIOS module is encased in a plastic housing for desk and provides 64 bi-directional I/Os, each accessible via boundary-scan. By driving and sensing I/O logic values, the structural integrity of edge and on-board connectors and logic clusters can be verified.
MIOS : JT2149 / DAF  
  • dual-purpose channels (channels B01 .. B16)
    • DIOS: 1.0V – 3.6V; 5V tolerant
    • Frequency counter: 10 Hz – 128 MHz
  • 1 channel (B01) programmable clock generator
    • range: 0.0596 Hz – 64 MHz in steps of 0.0596 Hz (59.6 mHz)
  • 12 analog input channels (channels A01 .. A12)
    • range: 0 to 32.768 V in step of 8 mV
    • accuracy: 2.5%
Boundary-scan controllers
 Standard Specifications  Catalog
  JT 5705/USB  
  JT 57XX/RMIc  
  JT 37x7  
  JT 3705/USB  
  JT 37x7/RMI The JT 37x7/RMI is now at status 'limited availability' and is not recommended for new projects - email info@jtag.com for stock status. Recommended alternative is JT 57xx/RMIc
  TAP PODs  
  JT 2147 QuadPOD  
  JT 2149/MPV  
  JT 2149/DAF  
  JT 2137 POD  
  JT 2147/eDAK for MAC Panel  
  JT 2147/VPC The JT 2147/VPC is a variant of the JTAG Technologies QuadPOD signal conditioning interface specifically designed for use within Virginia Panel Corporation's mass interconnect interface. The unit integrates both the JT 2148 transceiver circuitry, two independent, programmable TAP modules (of type JT 2149) and two TAP modules with I/O (of type JT 2149/MPV) on a single board that interfaces via the VPC QuadraPaddle connectors type G20x or G14x.

• Integrated four TAP QuadPod technology
• Match to DataBlaster PXI/PXIe controllers
• Simplifies wiring to mass interconnect interfaces
  DIOS and STM modules  
  JT 2111/MPV DIOS module
  JT 2111/MPV DIOS module
  JT 2124/F168 DIOS module
  JT 2128 DIOS module
  JT 2127 STM  
  JT 2149/MPV  
  JT 2702/PCI-Slot DIOS
  JT 2702/DDC DIOS adapter  
  JT 2127/Flex STM JT 2127-Flex is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialisation process may fail leaving you with little diagnostics information. What's more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain if you socket is soldered correctly.
Master DMU unit provides multiple DIO and analog channels Flex adapters are available for easy connection to popular DIMM sockets. Analog channels test supply voltages
  Accessories  
  JT 2135 TAP Extender The JT 2135 allows TAP signals to be extended away from the base JT 2137 (classic pod) by up to 1 meter and retain full pod's frequency specifications. The active circuitry inside the JT 2135 compensates for the TDO signal return time of the longer interface cable. Multiple JT 2135s can be implemented if a longer extension is required.
• Extends cable distance from pod to UUT
• Preserves signals integrity
• Compensates for TDO signal path delay
  JT 2139 TAP Isolator The JT 2139 is a TAP signal isolation module designed for use in 'combinational' test systems that utilise multiple instrument interfaces. To avoid parasitic capicitance effects and/or unwanted ground loops the JT 2139 can be used to completely galvanically isolate any JTAG Technologies boundary-scan controller from the remainder of the instrumentation system.

• Galvanically isolates TAP signals
• Simple compact design
• Universally applicable
  JT 2149 Connector JT 2149-con is the safe way to connect TAP pods and SCIL modules to the JT 37x7/RMI- 19" rackmount controller with DIOS. Included in the package is the connector/blanking plate that allows an easy connection to a JT 2149/RMI (the TAP pod for the RMI) for example via the supplied 1 metre extender cable.

• Safe easy connection extender of TAP pods to the JT 37x7/RMI.
• Helps to maintain signal integrity to the point of test.
• Simplifies system configurations
  JT 2154 ScanBridge The JT 2154 is an experiment board based on National Semiconductor's STA111 device, aimed at users looking to utilise addressable multiplexors within their designs, and thus set-up 'system level' JTAG access. The unit is also widely used in semi-permanent installations to expand the TAP (Test Access Port) count on JTAG Technologies testers in order to address highly segmented designs. Built-in support for ScanBridge-type devices within ProVision allows easy set-up of TAP assignments and device addressing.

• Use as 1:3 TAP multiplexor
• Experimental platform for system-level JTAG
• Features industry standard STA111 chip
  JT 2156 Training Board The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. The board was developed in co-operation with the Benelux regional representative of Altium - Transfer BV - and hardware development consultancy – DsignWorx BV. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design serves as an example of how to adapt the Nano board into a realistic custom design.
  Other instruments  
  JT 5112 MIOS
  SCIL modules SCIL modules are a range of pre-programmed pods that usually take the place of a regular TAP pod within the DataBlaster'sQuadPod system. Based on the JT 2149/MPV 32 channel DIOS module, SCIL modules are available for several logic functions. Alternative 'hosts' for SCIL functions can also be the JT 2111/MPV (desktop DIOS) or the JT 2122/MPV (DIMM DIOS). Currently available SCIL modules for enhancing test coverage are counter/timer and pattern generator/comparator units. Other SCIL modules, are used in tandem with a SCIP software module for in-system programming purposes. SCIP/SCIL combinations are used for programming Freescale parts via BDM, and Mono8 interfaces. SPI, I2C, SWD, and Microchip custom one-wire protocols are also supported.
Further SCIL module functions can be developed upon request, simply contact us or your local sales office.

• Bespoke logic functions that aid test coverage
• Available as pod plug-in or desktop unit
• Often used for in-system programming of non-JTAG part
  BSDL Verifier Using a sample boundary-scan IC, the JTAG Technologies BSDL generation/verification system automatically verifies the existing BSDL (Boundary-Scan Description Language) file or creates a BSDL file for the device if none exists, all in accordance with the IEEE 1149.1b Boundary-scan Standard. A BSDL file describes the boundary-scan characteristics of a specific device in terms of scan register lengths, ID codes, instruction codes, etc..

• Supports up to 512 signal pins
• Easy-to-use software and hardware
• Creates a BSDL model from hardware
• Includes a JT 3707 controller
  Tap Communicator

Contact jtag@inetest.co.in to get started.
For Online Training /Webinars visit http://www.jtag.com/en/webinars

 
   
   
 
 
 
 
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