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   :: UNIMET 1037 Stand Alone Version of TA37 for Discrete Semiconductors - Discrete semiconductors test system
 
  Features :
  » Fully compatible with TA37
  » Compatible with already written TA07D, T, F and Y tests
  » Lightweight design
  » All extensions of TA37 available
  » SCADUS control SW
  » Small footprint, easy to move
  » Testing in ranges 20V/100A, 600V/500mA, 52V/1A
  » HV07B extension compatibility for testing up to 2kV/19.5mA
  » board FPGA with AD/DA converters for advanced test control and DSP operation (Thermal resistance test, Dynamic resista nce test, tRR*, tON*, tOFF* and tDELAY*)
     
  Testing
  » Field Effect Transistors
  » Diodes
  » Zenner Diodes
  » Bipolar transistors
  » IGBTs
  » Thyristors / triacs
  » Arrays
     
  PARAMETERS
  DIODES & ZENNER DIODES
  » Forward voltage VF
  » Reverse voltage VR
  » Zenner voltage VZ
  » Reverse leakage current IR
  » Dynamic resistance DC Rdyn
  » Dynamic resistance AC Rz
     
 

MOS-FETS

  » Breakdown voltage V(BR)DSS
  » Inverse diode voltage VSD
  » Gate threshold voltage VGS
  » On resistance RDS(on)
  » Forward transconductance gfs
  » Forward/Reverse leakage current IGSS
  » On voltage VDS(on)
  » On-state drain current ID(on)
     
  BIPOLAR TRANSISTORS
  » Breakdown voltage VCE0(BR)
  » Breakdown voltage VCES(BR)
  » Saturation voltage VCE(sat)
  » Saturation voltage VBE(sat)
  » Breakdown voltage VCB0
  » Breakdown voltage VEB0
  » Diode forward voltage VF(diode)
  » Collector/Emitter cutoff current I ,I ,I CEO CBO EBO
  » On voltage VBE(on)
  » DC current gain hfe(DC)
  » AC current gain h21e(AC)
     
  TRIACS & THYRISTORS
  » Czech Republic www.unites-systems.com
  » Gate trigger current IGT
  » Gate trigger voltage VGT
  » Off-state leakage current IDO
  » Latch current IL
     
  TA37.TIM
  AC Parameters
  » Reverse Recovery Time tRR
  » Turn-on time tON
  » Turn-off time tOFF
     
     
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
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