Test Way

Design for Test and Test Coverage Analyzer

  • Electrical Design for Test 
  • Test Point Saving 
  • Place the Probes
  • Select manufacturing strategy 
  • Design to Build and Design to Test
  • Test for Designability

DFT FROM SCHEMATIC TO PRODUCTION

ASTER Technologies is the leading supplier in Board-Level Testability analysis tools, which capitalizes on proven expertise in board testability and strong customer relations. Founded in 1993, ASTER Technologies develops a suite of complementary products in electronics design and PCBA production markets.

Design and develop new products related to design, test and quality management.

Electrical Design for Test – When the schematic sheets are defined, TestWay verifies the testability by conducting electrical rules checking that reflect the Design for Test (DfT) guide lines. These can include standard and customer’s specific checks relating to company requirements.

Test Point Saving – By simulating the test strategy prior to the layout phase, TestWay helps to minimize the need for physical accesses that are necessary to detect defects aligned to the defect universe. It helps to reduce test point access by 30% to 70%!

Place the Probes – When the layout is finalized, test probe placement should be optimized according to test strategy definitions. The probe access information can then be used for estimating the test coverage, modeling the cost and calculating the production yield and TL9000 initial return rates.

Select manufacturing strategy – TestWay estimates test coverage using theoretical models that reflect the capabilities for a wide range of test and inspection strategies, such as: Automated Placement Machines (APM); Automatic Optical Inspection (AOI); Automated X-ray Inspection (AXI); Boundary-Scan Test (BST); Flying-probe Test (FPT); In-Circuit Test (ICT) and Functional Test These models should be tuned to reflect the test and measurement capabilities of each individual target tester.

Design to Build and Design to Test – TestWay exports CAD data in the native format useable by Assembly machines, Automated Optical Inspection, Automated X-Ray, In-Circuit testers, Flying probe testers and Boundary-Scan testers that is aligned to the simulated strategy. The exported files may include assembly and test programs, input lists, test models, as well as test fixture files used by the target testers. Any files created at the Design to Test stage can significantly reduce the downstream test development and fixture costs.

Test for Excellence – Once the test and inspection programs have been debugged and released, it is imperative to be able read the completed test program or test report and compare the coverage between the estimated and measured analysis.

Test for Designability – Test is an important contributor for design improvement, once a feedback loop between production and design has been established, such as a concurrent engineering approach to design and test.