Unites EFFITEST E & P Series

Ultra high-speed discrete semiconductor tester

FFITEST E-Series is ultra high-speed discrete semiconductor tester perfect for use in production. Throughput up to 72,000 UPH. Ideal for testing small signal transistors, diodes, LEDs, MOSFETs, JFETs and other semiconductors up to 800V / 20A. Lowest current range is 10nA. . Effitest E-Series series offers 3 models – e50, e51 and e52,  All configurations are up to 800V / 20A.
Effitest P-Series is State-of-the-art FPGA-based high-speed test system for mass production of power discrete semiconductors. It is based on Effitest test platform with extension of high voltage and high current modules. With this configuration, Effitest P-Series is an ideal choice for testing IGBTs, MOS-FETs, Power modules and other high power semiconductors.

Key Features

  • Effitest e50 max. ranges up to 600V/6A 
  • Effitest e51 max. ranges up to 800V/10A 
  • Effitest e52 max. ranges up to 800V/20A 
  • Single (3 pin), Dual (e50, 3 + 3 pin) and Quad (e90, 3 + 3 + 3 + 3 pin) configuration
  • Pincount extendable up to 10 pins by external multiplexer MUX10 
  • Connection to a handler or a wafer prober
  • Up to 32 HW bins and 256 SW bins
  • Throughput up to 72,000 UPH /  less than 35 ms to test a bipolar transistor
  • Parallel and serial testing
  • Virtual scope – internal instrument allowing display of waveforms
  • Menu-driven test editor for easy programming test programs
  • Final test & QA test ready

Testing

  • Bipolar transistors 
  • MOSFETs (also GaN and SiC)
  • Diodes & Zener diodes
  • Voltage regulators
  • LED, Photodiodes, Optocouplers 
  • Phototransistors 
  • MOSFET Drivers
  • IGBT Drivers

Areas Of Application

  • High volume production testing
  • Quality control
  • Failure analysis
  • Engineering testing