3030M In-Circuit Tester

3030M is the multi-function, fully upgradable and customizable ICT tester, expressly designed to combine full test coverage and the lowest cost of test into a unique manual test equipment. Modular and configurable with a wide range of instrumentation and receivers, 3030M provides 4x throughput compared with standard testers.

Key Features

  • -75% test cost with True Parallel Test
  • Multi-Function Architecture
  • Multi-Stage Testing
  • Multifunction: full test coverage
  • True Per-Pin Architecture 
  • Cable-less Instrument Connection
  • Equippable with power instrumentation
  • Automatic test program generation
  • Parallel On Board Device Flashing

Application

Aerospace and defence

Automotive

consumer electronics

EMS

energy and Solar

Home appliance

lighting

Medical

Mobil & communication

Tuch display test

Repair

Test Capabilities

IN-CIRCUIT TEST

OPEN PIN SCAN

POWER ON TEST

FUNCTIONAL TEST

FLASHING

LIGHT TEST

BOUNDARY SCAN

BUILT-IN-SELF-TEST

OPTICAL TEST

HIGH POWER TEST

DIGITAL TEST

100% SHORT CIRCUIT TEST

Technical Data

Discharge Capacitor Test Discharge Capacitor Test to avoid damages of the machine and the UUT due to charged capacitors
Short Circuit Test
  • Short Circuit Test – All Nets
  • Short Circuit Test – Low Impedance
Open Pin Test
  • Open Pin Test – Junction Scan
  • Open Pin Test – Electro Scan
Power Supply Test
  • Supply Current Test
  • Internal Voltage Test
  • Voltage Regulators Test
ICT Power On
  • Standard ICT Test
  • Analog IC Test
  • Digital IC Test
  • Oscillator ICT Test
Node Voltage Test
  • Node Voltage Test
Optical Test
  • Presence Test – Parts not ICT Tested
  • Presence Test
  • XY Alignment Test
  • Character Recognition Test