SPEA 3030IL

3030IL is the fully automatic bed-of-nails tester expressly designed to minimize the cost of test, providing unparalleled throughput without requiring the operator to load the PCB or perform the test. It can be quickly integrated into SMEMA production lines or used with standard automatic board loaders/unloaders. Modular and fully upgradable, 3030IL combines a wide range of test capabilities in a unique, integrated, high-throughput, cost-effective system.

4 Cores

5000+ Tests/Sec

Fast Board Loading

Parallel test

Key Features

4x throughput with 4-Core Architecture
Multi-Function Architecture
Multi-Stage Testing
True Per-Pin Architecture
Ultra-fast handling in 3 sec.
5000+ tests/sec
Automatic test program generation
Parallel On Board Device Flashing
Cable-less Instrument Connection
PC-Independent Architecture
Ultra-Fast Conveyor and In-line Loading

Application

Aerospace & Defence

Automotive

Consumer Electronics

EMS

Energy & Solar

Home Appliance

Lighting

Medical

Mobil & Communication

Tuch display test

Repair

Test Capabilities

IN-CIRCUIT TEST

OPEN PIN SCAN

POWER ON TEST

FUNCTIONAL TEST

FLASHING

LIGHT TEST

BOUNDARY SCAN

BUILT-IN-SELF-TEST

OPTICAL TEST

HIGH POWER TEST

DIGITAL TEST

100% SHORT CIRCUIT TEST

Technical Data

Discharge Capacitor Test	Discharge Capacitor Test to avoid damages of the machine and the UUT due to charged capacitors
Short Circuit Test	short Circuit Test – All Nets Short Circuit Test – Low Impedance
ICT Power Off	Safe ICT Power Off – @max 0.3V-5mA Standard ICT Power Off – @max 10V-100mA Hi-Accuracy ICT Power Off @ 0.1% Accuracy Hi-V ICT Power Off – @ 10V-100V Stress ICT Power Off – @ up to 3A Dynamic V/I ICT Power Off – @ 1µs V/I Timing
Open Pin Test	Open Pin Test – Junction Scan Open Pin Test – Electro Scan
Power Supply Test	Supply Current Test Internal Voltage Test Voltage Regulators Test
ICT Power On	Standard ICT Test Analog IC Test Digital IC Test Oscillator ICT Test
Node Voltage Test	Node Voltage Test