PRODUCTION INTEGRATION PACKAGES (PIP)

COMPLETING YOUR AUTOMATIC TEST STATION 

At run-time the test sequence is executed to test the entire board. JTAG Technologies’ run-time solutions may be stand-alone or may be part of your total test solution (JTAG Inside). Production Integration Packages are available for LabVIEW, LabWindows, TestStand, C, C++, C#, .NET, Visual Basic, ATEasy. Also certified packages (Symphony products) are available for in-circuit testers and flying probe testers from Agilent, Teradyne, Digital Test, Seica, Spea.

Production Integration Packages Benefits

  • No need for production operators to learn a new (graphical) user interface
  • Increased test coverage and diagnostic capabilities of your existing test stations
  • Shorter production repair times and reduced repair costs
  • Easy integration of JTAG Test and ISP results in your tracking and tracing reports
  • Unchanged logistics surrounding for your existing test stations

Completing Your Automatic Test Station

In a high volume production environment the test station is often a Go / No-Go station. Failing products are removed from the line and transported to a separate repair station. In this case adding a JTAG Technologies’ Production Integration software Package (PIP) plus a JTAG Controller and optionally some I/O hardware is generally enough to enhance your production test station with JTAG capabilities.

JTAG Technologies’ boundary-scan Diagnostics software package (BSD) helps to quickly relate test failures to their physical cause. Running BSD on your repair station will help to minimize the repair time. BSD reports in text format the cause of the errors detected with the JTAG tests. 

JTAG Visualizer can highlight in the schematics and/or layout of the target board, the nets, pins and components, associated with the detected faults as reported by BSD. Adding JTAG Visualizer software helps to reduce the repair time even further.

The increasing complexity of devices used on boards – eg. System on Chips (SoCs) – causes a drop in coverage and reduced diagnostics capabilities of existing test systems.

By adding a PIP package to a test system its test coverageand failure localization capabilities are highly improved for boards containing one or more JTAG compatible devices.

The addition of JTAG test and ISP applications helps toshorten the repair times in the factory and decrease therepair costs for such boards.

Seamless Integration

Production Integration Packages (PIP) allow for a seamless integration of JTAG applications in a wide variety of existing environments on the factory floor. Microsoft C/C++, Microsoft .NET assemblies, Visual Basic, Marvin Test Solutions’ ATEasy and National Instruments’ LabVIEW, LabWindows/CVI and TestStand are all supported through individual PIP packages comprising of the software execution modules and instrument control libraries for that environment.

JTAG TECHNOLOGIES SYMPHONY INTEGRATION SOLUTION FOR SPEA 3030/40X0 SERIES

In co-operation with the engineers of SPEA Spa, Italy,  JTAG Technologies developed a version of the JT 2147 QuadPod that fits perfectly in to the instrumentation chassis of SPEA’s 3030 in-circuit tester. This JT 2147/SAM connects the TAP signals via the standard JT 3727/TSI controller and fixture to the UUT. For the 40X0 flying probe tester integration, a standard JT 2147 pod is used. To simplify  test development a data-package exported from SPEA’s Leonardo software includes all test point information and allows rapid application generation from within JTAG Technologies ProVision software. During application debug/validation  ProVision can even take control of the probes to speed-up this process.. Digital signals can be driven via boundary-scan and sensed with the I/O pins or flying probes of the SPEA machine and the other way around. Results and diagnostics are presented in the Leonardo run-time GUI.

  • Supports all ICT and Flying Probe Testsystems (FPT) from SPEA
  • Fast integration of the boundary-scan hardware right in the SPEA systems rack
  • Simple test program creation and debugging using JTAG ProVision™, via full access to the SPEA ICT/FPT channels
  • Optimized transfer of Leonardo™ data to ProVision
  • Familiar integration of boundary-scan tests using Leonardo™user interface including error analysis in case of error
  • an increase in test coverage while reducing adapter costs 



Application

  • Mid – to high volume production
  • Boundary-scan testing: infra, interconnections, memory connections, clusters
  • Combined testing of ICT and boundary-scan
  • Flash programming
  • PLD Programming




Beneifits

  • One GUI (SPEA) during production runs
  • Higher coverage
  • Combined report
  • Only one production step
  • Improved fault coverage
  • Simplified fixture
  • Validation of the combined tests in the ProVision Test development environm