SPEA H3580 is a pick&place test handler, designed to perform the high-throughput handling of IC components (packaged, or in strip/wafer frame) during the final test phase. Its modular design is open to compose a variety of input / output media configurations, to best fit with any process flow, with the possibility to modify the configuration also at the customer’s site, by retrofitting different input / output modules. Mechanical architecture is based on full linear motion technology, which features controlled axis acceleration and speed, to guarantee fast and accurate handling. Motion profiles and contacting mechanisms minimize the force applied to the devices: This makes H3580 able to handle MEMS devices with no risk to cause extra shock to their internal micromechanical structures.