SPEACT Series is a family of testers for identification devices, designed to satisfy all the test requirements of smart card modules (contact, contactless and dual-interface) and RFID devices, which utilize standard or customized protocols. 

These highly configurable and scalable testers can quickly perform all the measurements to satisfy both parametric and functional test requirements of today’s and tomorrow’s devices.

When used for final test, CT testers can be connected to SPEA’s H1000 reel-to-reel handlers, or to third-party handlers. When used for wafer test, they can be connected to the prober via dedicated cables.