DOT 800C
DOT800C is an innovative mixed signal tester, based on a revolutionary tester-in-a-board concept: All the resources required to test one – or multiple – devices are housed on a single instrument board, so as to greatly simplify the load board connections between tester channels and device under test.
The multi-core tester base unit incorporates in the space of a compact test head the capabilities of two traditional cabinet-based testers (over 5,000 channels), reducing the footprint (the entire tester can fit on top of the wafer prober) and the required investment.
The instrument architecture incorporates all the resources for analog, digital and signal processing in a single, powerful board, that also includes multiple control CPUs, DSP modules and programmable logic units. The LPE board is modular and configurable: It can be composed with an on-board controller, and up to four channel cards that can be selected to build the perfect performance mix to satisfy the device test requirements, for a total of up to 256 channels in a single instrument slot. Each individual channel card features a dedicated matrix card, that allows you to simplify the load board design and reduce the quantity of relays installed on the application. The tester can be populated with one-type instruments, greatly simplifying system composition, programming and maintenance, while satisfying at best all the device test requirements.
Key Features
- Multi-core architecture, with independent CPU per core.
- Up to 5,000 channels in a test-head-only system.
- Direct probe card docking (no need for load board or pogo tower).
- PC-performance independence: system PC / Windows version can be updated with no need for test program requalification.
- Predictive maintenance: the system automatically launches self-calibration procedures and measurement adjustments, while all the instruments have sensors and on-board memory used to evaluate their health status and mechanical wear
Instrumental Capability
- Analog Pin up to ±80V; ±400mA.
- Digital Pin up to 3.2Gbps.
- Signal Processing: Arbitrary Waveform Generator and Digitizer.
- Low Power V/I Source: ±10V; 600mA pulsed and 200mA
- continuous; stackable up to 160V and 9.6A.
- Medium Power V/I Source: ±100V, ±2A.
- High Power V/I Source: ±400V.
- Small Value Measurement: very low current (pA), capacitance (fF) and voltage (µV) measurements.
- 5G Test up to 81GHz band.
- High Power Generators: voltages up to 20KV (measuring leakage current), currents up to 4kA pulsed.